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- Ronald Dixson - Physicist at NIST | LinkedIn
View Ronald Dixson’s profile on LinkedIn, a professional community of 1 billion members
- Ronald G. Dixson | NIST
Ronald Dixson is a physicist in the Microsystems and Nanotechnology Division His current research interests are calibration methods, traceability, and uncertainty analysis in atomic force microscope (AFM) dimensional metrology
- Ronald G. Dixson | IEEE Xplore Author Details
Ronald G Dixson received the Ph D degree in physics from Yale University, New Haven, CT He has been a Staff Scientist in the Manufacturing Engineering Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD, since 1994
- Ronald DIXSON | National Institute of Standards and Technology | NIST . . .
Nanoscale wear affects the performance of atomic force microscopy (AFM)-based measurements for all applications including process control measurements and nanoelectronics characterization As such,
- Ronald Dixson - Google Scholar
NIST - Cited by 2,801 - atomic force microscopy - measurement - metrology - calibration
- Ronald Dixson - National Institute of Standards and. . | ZoomInfo
Ronald Dixson has been working as a Physicist at National Institute of Standards and Technology for 30 years National Institute of Standards and Technology is part of the Federal industry, and located in Maryland, United States
- Dr. Ronald G. Dixson Profile - SPIE Digital Library
Accurate integration of quantum dots and bullseye cavities Dude, where’s my beam? Placement accuracy by localization microscopy Search the SPIE Digital Library, the world's largest collection of optics and photonics peer-reviewed applied research Subscriptions and Open Access content available
- Ronald G. Dixson | ScienceDirect
Nous décrirons le travail mené au National Institute of Standards and Technology pour faire progresser ces instruments, ainsi que le travail exploratoire sur deux techniques nouvelles prometteuses que sont la microscopie en champ diffracté et la diffraction de rayons X aux petits angles
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