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- Low-energy ion scattering - Wikipedia
Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials
- Hawaiian Leis | Graduation Wedding Leis | Fast Delivery Nationwide
Explore our top-selling Hawaiian leis and earn loyalty points with every purchase From stunning festive orchid leis, to elegant wedding leis and thoughtful birthday gifts, our handmade leis are made with local pride and Aloha
- 低能粒子散射谱 - 百度百科
低能离子散射谱（Low-Energy Ion Scattering，LEIS）利用具有特定能量的惰性气体离子入射到样品表面，与样品表面的原子进行弹性碰撞。 根据弹性散射理论，散射离子的能量分布与表面原子的原子量相关。
- Hawaiian Leis - Largest Selection of Fresh Hawaiian Leis
Welcome to Aloha Island Lei! The largest selection of fresh leis for any occasion and special moments We offer a great value for premium, handcrafted Hawaiian lei in a huge assortment of styles, woven modern and in the traditional styles of native Hawaiians Schedule your delivery date or chat with us to ship your leis out today
- 低能离子散射 (LEIS) 及其应用最新进展综述,Microscopy and Microanalysis - X-MOL
低能离子散射 (leis) 允许以仅最顶层原子层的灵敏度分析材料表面。在 leis 实验中，能量为几 kev 的惰性气体离子从样品表面散射。离子在散射过程中的能量损失取决于散射体的质量，因此通过记录背散射离子的能量损失谱，可以得到样品表面的定量元素组成。
- Hawaiian Leis: Flowers, Customs, and Respect - The Hale Pau Hana
Leis in Hawaii can feature an array of colors and a diverse range of flora, each imbued with unique significance Orchids, for instance, are a popular choice for their long-lasting beauty and come in a variety of colors, contributing to the lei's overall message
- LEIS的定量分析_哔哩哔哩_bilibili
leis的定量分析: 低能离子散射能谱（leis）是一种可以对样品表面最外原子层中元素组成进行定量分析的表面分析技术。 该视频阐述了leis为什么可以做定量分析，以及leis的定量分析在实践中的应用。
- Low Energy Ion Scattering (LEIS) Spectroscopy | SpringerLink
In the abstract, High-sensitivity low-energy ion scattering spectroscopy (HS-LEIS) is a highly sensitive surface analysis method of solids that possesses the following characteristics: (i) depth resolution of ~0 3 nm corresponding to one atomic layer, (ii) depth profiling of the layers below the outermost surface, (iii) detection of trace
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