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- ZYGO | Precision Optical Metrology | Optical Components
ZYGO is a worldwide supplier of optical metrology systems, custom optical components, and complex electro-optical systems design and manufacturing
- About Us - Zygo Corporation
Zygo is a global leader in the design and manufacture of advanced optical metrology systems and ultra-precise optical components and assemblies Our mission is to enable customer success by delivering innovative precision optical and metrology solutions that exceed expectations
- Metrology Systems, Optical Components Assemblies | ZYGO
Zygo Corporation is a global leader in the design and manufacture of advanced optical metrology systems and ultra-precise optical components and assemblies Our mission is to enable customer success by delivering innovative precision optical and metrology solutions that exceed expectations
- History - Zygo Corporation
In 1977, Zygo introduced ZIPP – the Zygo Interference Pattern Processor – as the first commercially available method of quantitative interferogram data reduction, either from an interference pattern displayed on a video monitor or from a Polaroid® print
- Optical Components - Zygo Corporation
ZYGO is a premier fabricator of high precision optical components Our reputation has been earned by consistently exceeding customer expectations, even when the project has a high degree of difficulty
- Nexview™ NX2 - Zygo Corporation
Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler
- ZeGage pro optical profiler - Zygo Corporation
Built on ZYGO’s proprietary CSI technology, the ZeGage Pro delivers innovative technologies to enable precise, reliable, simple, and confident surface metrology
- Metrology Systems | Non-Contact | High Precision | ZYGO
Zygo provides high-precision surface topography metrology systems and optical metrology systems to measure a variety of properties
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